EZINE:
This month's MicroScope ezine looks at the issues around device as a service (DaaS), the outlook from HP and a report from the UK CompTIA conference.
EBOOK:
To celebrate Computer Weekly's 50th anniversary, the National Museum of Computing, which holds the print archives of the magazine, has scanned the first issue of Computer Weekly. We have made this available to download.
EGUIDE:
The National Museum of Computing has trawled the Computer Weekly archives for another selection of articles highlighting significant articles published in the month of June over the past few decades.
ESSENTIAL GUIDE:
Computer Weekly's CW500 Club heard from IT leaders plotting a roadmap to software-defined everything – this presentation was given by Rob White, executive director of the global database group at Morgan Stanley.
EGUIDE:
Access this e-guide to get a strategy in place to ease your transition to HCI and reduce your hardware needs, as well as time spent working on storage and hypervisors.
EGUIDE:
Knowing what questions to ask and how to avoid common deployment errors when implementing NVMe technology will save you time and money. Save yourself from a great deal of frustration with this E-Guide, which covers the mistakes you'll need to avoid and the questions you'll need to ask when deploying NVMe.
EZINE:
Global IT budgets are finally on the increase, according to a survey from CW Europe/TechTarget – but Europe has reported the lowest predicted growth for 2015. This issue of CW Europe offers guidance to IT leaders by revealing what other businesses in your region will be focusing their efforts on this year.
RESOURCE:
Explore this in-depth resource to discover how the migration to Linux impacts organizations, as well as information about other ways to remove cost and complexity from IT infrastructures.
EBOOK:
In this software age, is there any role left for hardware? In our three-part guide, our experts' response is a resounding, "yes." Read now to learn why hardware is still an essential networking choice in terms of scale, reliability, and performance.
